Měření fyzikálních vlastností
Zde naleznete certifikované referenční materiály, které slouží jako standardy pro analýzu fyzikálních vlastností látek. Naleznete zde standardy pro měření indexu lomu, hustoty, viskozity, elektrické vodivosti, bodu tání etc.
Kdyby jste přeci jen nenašli, co hledáte, neváhejte nás kontaktovat.
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_6ssl-od.png)
Rockwell C Scale Hardness - High Range
SRM2812
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_1mh8-ej.png)
Rockwell Hardness 15N Scale - Low Range (Nominal 72 HR15N), 1 blok
SRM2816
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_8l9r-eb.png)
Rockwell Hardness 15N Scale - Mid Range (Nominal 83 HR15N), 1 blok
SRM2817
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_oq48-xt.png)
Rockwell Hardness 15N Scale - High Range (Nominal 91 HR15N), 1 blok
SRM2818
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_6lyp-ie.png)
Rockwell Hardness 30N Scale - Low Range (Nominal 45 HR30N), 1 blok
SRM2819
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_7dh1-g6.png)
Rockwell Hardness 30N Scale - Mid Range (Nominal 64 HR30N), 1 blok
SRM2820
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_i67y-wo.png)
Rockwell Hardness 30N Scale - High Range (Nominal 79 HR30N), 1 blok
SRM2821
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_xcyx-7r.png)
Knoop Microhardness of Steel
SRM2828
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_r7i0-pi.png)
Knoop Hardness of Ceramics
SRM2830
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_n8tg-c7.png)
Vickers Hardness of Ceramics and Hardmetals
SRM2831
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_pzvh-i1.png)
Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers (Al mole fraction x near 0.20), disk
SRM2841
Detail produktu
![](https://www.analytika.net/images/thumbnails/80/80/detailed/15/NIST_logo_q8vj-9m.png)
Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers (Al mole fraction x near 0.30), disk
SRM2842
Detail produktu